3
- 3A
a
- AArch32
- Classic ARM
- arm32
- Arm32
- AArch64
- arm64
- Abstract Class
- Abstract Data Type
- Abstract Interface
- Abstraction
- abstraction
- Accelerometer [Accel]
- Access Point
- Active Alignment [AA]
- Active Design Review
- Active Object [AO]
- Actor [AO]
- Active Reviews for Intermediate Designs [ARID]
- Ada
- Adapter Pattern
- Adapter
- ADR
- Advanced Encryption Standard [AES]
- AES CCM
- Algorithmic Thinking
- Amplitude Modulation [AM]
- Analog-to-Digital Converter [ADC]
- Angle of Arrival [AoA]
- Angle of Departure [AoD]
- Annual Recurring Revenue [ARR]
- AOI
- AP
- Application-Binary Interface [ABI]
- Application Processor
- Application Programming Interface [API]
- Application-Specific Integrated Circuit [ASIC]
- Application Test Suite
- Architecturally Significant Requirement [ASR]
- Architecture Analysis and Design Language [AADL]
- Architecture-centered Software Project Planning [ACSPP]
- Architecture Decision Record
- Architecture Description Language [ADL]
- Architecture Documentation [AD]
- Architecture Tradeoff Analysis Method [ATAM]
- Area of Interest
- Region of Interest
- ARM
- ARM Architecture Procedure Call Standard [AAPCS]
- Aspect-Oriented Programming [AOP]
- Aspect-Oriented Software Development [AOSD]
- Assertion
- Assisted GPS [A-GPS] [A-GPS]
- Association Relationship
- Asymmetric Multiprocessing [AMP]
- Asynchronous Transfer Mode [ATM]
- Attach Rate
- Attribute-Driven Design [ADD]
- Audio-Frequency Choke [AFC]
- Auto-Exposure [AE]
- Auto-White Balance [AWB]
- Autofocus [AF]
- Automated Optical Inspection
- Automated Test System [ATS]
- ATE [ATS]
- Automated Test Equipment [ATS]
- Automated X-ray Inspection [AXI]
b
- Ball Grid Array [BGA]
- Battery Management System [BMS]
- Battery Management Unit [BMS]
- BMU [BMS]
- Big Design Up Front [BDUF]
- Bill of Materials [BOM]
- Bipolar Junction Transistor [BJT]
- Bit Error Rate [BER]
- Bit Rate [BR]
- Bit Rot
- Code Rot
- Bluetooth [BT]
- Bluetooth Low Energy [BLE]
- Board Support Package [BSP]
- Board-to-Board Connector [B2B]
- Boost
- Bottom-Half Handler
- Bounds Checking
- Boundary checking
- bounds check
- bounds checks
- bound checking
- boundary checking
- Bounds checking
- Bring-up [BU]
- Buck
- Buffer Overflow
- Buffer overflow
- buffer overflow
- Buffer Overrun
- buffer overrun
- Buffer overrun
- Build System
- Bus Fault Address Register [BFAR]
- Bus Fault Status Register [BFSR]
- Byte Stuffing
c
- C
- Callback Function [CB]
- Callback [CB]
- Capability Maturity Model
- Capacitor
- CCM Mode
- Change Control Board [CCB]
- Channel State Information [CSI]
- Checksum
- Chip on Board [COB]
- Chromatic Abberation [CA]
- Clear to Build [CTB]
- Code Change Control [CCC]
- Code Signing
- Digital Signature
- Cohesion
- Color Correction Matrix [CCM]
- Color, Material, Finish [CMF]
- Color Matrix
- Commercial Off-the-Shelf [COTS]
- Off-the-Shelf [COTS]
- OTS [COTS]
- Compatibility
- Forward Compatibility
- Backward Compatibility
- Complex Instruction Set Computer [CISC]
- Complex Process Capability [CPK]
- Component
- Component and Connector [C&C] [C&C]
- Concise Binary Object Representation [CBOR]
- Configuration Table Pattern
- Connection Signature Resolving Key [CRSK]
- Consistent Overhead Byte Stuffing [COBS]
- Constrained Application Protocol [CoAP]
- Context Switch
- Continuous Integration [CI]
- Contract Manufacturer [CM]
- Contrast Value [CV]
- Contributing Guide
- CONTRIBUTING
- Cooperative Scheduling
- Cooperative Multitasking
- Coordinate Measurement Machine [CMM]
- Cortex-A
- Cortex-M
- Cortex-R
- Cost of Goods Sold [COGS]
- Coupling
- Decoupling
- C++
- Critical Section
- Current Program Status Register [CPSR]
- Current Sink
- Current Source
- Customer Acquisition Cost [CAC]
- Customer Lifetime Value [CLV]
- LTV [CLV]
- Lifetime Value (of a Customer) [CLV]
- Cycle Time
- Cyclic Redundancy Check [CRC]
d
- Data Collection Module [DCM]
- Database Management System [DBMS]
- DCM
- Dead-on-Arrival [DOA]
- Deadline-monotonic Scheduling
- Debugging [Dbg]
- Decision Feedback Equalizer [DFE]
- Delta Update
- Department of Defense Architecture Framework [DoDAF]
- Dependency Injection [DI]
- Dependency Inversion Principle
- Dependency Structure Matrix [DSM]
- Descriptor
- Design for Cost [DFC]
- Design for Manufacturing [DFM]
- Design for Variability [DFV]
- Design-for-X [DFX]
- Design of Experiments [DOE]
- Design Pattern
- Design-to-Cost [DTC]
- Design Validation and Test [DVT] [DVT]
- Device Firmware Upgrade [DFU]
- Device Under Test [DUT]
- Devicetree
- DiBit
- Digital Multimeter [DMM]
- Digital Signal Processor [DSP]
- Digital-to-Analog Converter [DAC]
- Digital Voltmeter [DVM]
- Direct Memory Access [DMA]
- Direct Test Mode [DTM]
- Directly Responsible Individual [DRI]
- Domain Driven Design [DDD]
- DQ
- Dual In-line Package [DIP]
- Dynamic Library
- Dynamic Program Analysis
- Dynamic Analysis
e
- Earliest Deadline First Scheduling [EDF]
- Earliest Deadline First [EDF]
- ECDSA
- Effective Number of Bits [ENOB]
- Electrical Engineering [EE]
- Electro-magnetic Interference [EMI]
- Electro-static Discharge [ESD]
- Electronic Image Stabilization
- Elliptic Curve Cryptography [ECC]
- Embedded ABI [EABI]
- Embedded Display Port [eDP]
- Embedded FPGA [eFPGA]
- Embedded Multimedia Controller [EMMC]
- Embedded Template Library [ETL]
- Encapsulation
- Encrypted Diversifier [EDIV]
- End of Frame [EOF]
- End of Life [EOL]
- Engineering Change Order [ECO]
- Engineering Change Note [ECO]
- ECN [ECO]
- Engineering Prototype [EP]
- Engineering Validation and Test [EVT]
- Enhanced Data Rate [EDR]
- Enhanced Host Controller Interface [EHCI]
- Enterprise Resource Planning [ERP]
- Entity-Relationship Diagram [ERD]
- Event Loop
- Message Pump
- Message Loop
- Message Dispatcher
- Event Dispatcher
- Run Loop
- Execute-in-Place [XIP]
- Extensibility
- Extensible Markup Language [XML]
- External Image Stabilization [EIS]
- External Interrupt [EXTI]
- Extreme Programming [XP]
f
- Facade Pattern
- Failure Analysis [FA]
- Fallout
- Fan
- Fast Fourier Transform [FFT]
- Fault-Tolerant Unix [FTX]
- Federal Enterprise Architecture Framework [FEAF]
- Field-Effect Transistor [FET]
- Field-Programmable Gate Array [FPGA]
- Final Assembly [FASY]
- Final Assembly, Test, and Packout [FATP]
- Final Quality Control [FQC]
- Final Quality Audit [FQC]
- FQA [FQC]
- Final Quality Check [FQC]
- Finite State Machine [FSM]
- Finite State Automata [FSM]
- State Machine [FSM]
- Firmware [FW]
- First Article Inspection [FAI]
- First-Pass Yield [FPY]
- Fixtureless In-circuit Test [FICT]
- Flying Probe Tester [FICT]
- Flat Flexible Cable [FFC]
- Flexibility
- Flexible Printed Circuit [FPC]
- Floating
- Floating-Point Unit [FPU]
- Foreign Objects & Debris [FOD]
- Form Factor [FF]
- Framework
- Framing
- Frequency Modulation [FM]
- Frequency Shift Keying [FSK]
- Front-side Bus [FSB]
- FTX
- Functional & Connectivity Testing [FCT]
- Functional Requirement
- FW
g
- Gage Repeatability and Reproducibility [GR&R] [GR&R]
- Gage Repeatability and Reproducibility
- General Purpose I/O [GPIO]
- Generalization/Specialization Relationship
- Inheritance
- Generation Gap Pattern
- Generation Gap
- Gigabit Multimedia Serial Link [GMSL]
- git
- Global Supply Manager [GSM]
- GMSL
- GNU Debugger [gdb]
- Gross Margin [GM]
- Ground [GND]
- Gyroscope [Gyro]
h
- Hardware Abstraction Layer [HAL]
- Hardware Dependent Software [HDS]
- Hierarchical State Machine [HSM]
- Statechart [HSM]
- High Drive
- High-Impedance [High-Z] [High-Z]
- High-Level Architecture [HLA]
- High-Performance Computing [HPC]
- Host Controller Interface [HCI]
- Hot Bar
- HPC
- Human Computer Interaction
- Human Interface Device [HID]
i
- I/O
- IL
- Image Quality [IQ]
- Image Signal Processor [ISP]
- Imprint Lithography [IL]
- In-Circuit Emulator [ICE]
- In-Circuit Testing [ICT]
- In-Circuit Testing
- In-process Quality Control [IPQC]
- In-System Programming
- Incoming Quality Control [IQC]
- Industrial Design [ID]
- Inertial Measurement Unit [IMU]
- Information Hiding
- Input/Output [IO / I/O] [IO / I/O]
- Instruction-Set Architecture [ISA]
- Integrated Circuit [IC]
- Intel 8086 [8086]
- i8086 [8086]
- Intellectual Property
- Inter-IC Communication [I2C]
- Inter-IC Sound [I2S]
- Inter-Process Communication [IPC]
- Interface Control Document [ICD]
- Interface Description Language [IDL]
- International Organization for Standardization [ISO]
- Internet of Things [IoT]
- Internet Protocol
- Interrupt Coalescing
- Intersymbol Interference [ISI]
- IP
- IP core
- ISO
j
- JavaScript Object Notation [JSON]
- JTAG
- Just-in-Time [JIT]
k
- Kconfig
- Key Rotation
l
- Lead-Time [L/T] [L/T]
- Leaky Abstraction
- Least Significant Bit [LSB]
- Level of Effort [LOE]
- libc
- LiFi Standard (802.11bb) [LiFi]
- 802.11bb [LiFi]
- Linear Voltage Regulator
- Linear Regulator
- LDO
- Low-dropout linear regulator
- Lines of Code [LOC]
- Link Register [LR]
- Linker Map
- Map File
- Linker Script
- Liskov Substitution Principle [LSP]
- Load Memory Address [LMA]
- LOC
- LOE
- Long-Term Key [LTK]
- Look-up Table [LUT]
- Looks-like Prototype
- Loopers
- Low-Voltage Differential Signaling [LVDS]
m
- Mach-O
- Machine Learning [ML]
- Main Logic Board [MLB]
- Main Pattern
- Maintainability
- Manufacturer Part Number [MPN]
- Manufacturing [Mfg]
- Manufacturing Execution System [MES]
- Manufacturing Firmware
- Manufacturing Services Agreement [MSA]
- Manufacturing Test
- Markdown
- Mass Production [MP]
- Master Issue List [MIL]
- Master Production Schedule [MPS]
- Material In-House [MIH]
- Material PM [MPM]
- Maximum Likelihood Sequence Estimation [MLSE]
- Mean Time Between Failures [MTBF]
- Mean Time to Failure [MTTF]
- Mean Time to Repair [MTTR]
- Mechanical Control Outline [MCO]
- Mechanical Engineer [ME]
- Media Access Control [MAC]
- Mediator Pattern
- Memory Decryption Integrity Unit [MDIU]
- Memory Management Fault Status Register [MMSR]
- Memory Management Unit [MMU]
- Memory-Mapped I/O [MMIO]
- Memory Scribbling
- Message Authentication Code
- Message Passing
- Messaging Queueing Telemetry Transport [MQTT]
- Messsage Queue
- Event Queue
- Mailbox
- Microcontroller Unit [MCU]
- Microsoft Visual C++ [MSVC]
- Middle of Frame [MOF]
- Minimum Order Quantity [MOQ]
- MIPI Camera Serial Interface [MIPI CSI] [MIPI CSI]
- MIPI Display Serial Interface [MIPI DSI] [MIPI DSI]
- MIPI Touch
- Mobile Industry Processor Interface [MIPI]
- Model-View-Controller [MVC]
- Modeling and Analysis of Real-Time Embedded Systems [MARTE]
- Modifiability
- Modularity
- Module
- MOF
- Monthly Recurring Revenue [MRR]
- MOSFET
- Most Significant Bit [MSB]
- Moving Average
- Running Average
- Running Mean
- Rolling Average
- Cumulative Moving Average
- MPU
- MSVC
- Multicore Association [MCA]
- Multicore Communications API [MCAPI]
- Multicore Resource Management API [MRAPI]
- Multicore Task Management API [MTAPI]
- Multimedia Card [MMC]
- Mutex
n
- National Institute of Standards and Technology [NIST]
- NDF
- Near-Field Communication [NFC]
- Nested Vector Interrupt Controller [NVIC]
- Network Interface Controller [NIC]
- Neural Network [NN]
- New Product Introduction [NPI Process]
- New Product Development [NPI Process]
- NPD [NPI Process]
- New Product Introduction [NPI Process]
- NPI [NPI Process]
- NFF
- NG
- NISTIR
- No Defect Found [NDF]
- Non-Enclosed Device [NED]
- Non-Functional Requirement [NFR]
- Quality Attribute [NFR]
- Non-Recurring Engineering [NRE]
- Non-Uniform Memory Access [NUMA]
- Non-Virtual Interface Pattern
- NVI Pattern
- Non-Virtual Interface
- NPN
- NTBF
- NTF
o
- Object Management Group [OMG]
- Observer Pattern
- Publish-Subscribe Pattern
- Pub/sub
- Off-the-Shelf [OTS]
- Commercial-off-the-Shelf [OTS]
- COTS [OTS]
- On-Chip Debugging [OCD]
- On-Chip Debugger [OCD]
- One Time Programmable [OTP]
- Open-Closed Principle [OCP]
- Open-Collector
- Open-Drain
- OpenOCD
- Operating System [OS]
- Operating System Abstraction Layer [OSAL]
- Operational View [OV]
- Optical Center [OC]
- Optical Measurement Machine [OMM]
- Optoelectronics, Sensors, and Discrete Devices [OSD]
- Original Contract Manufacturer [OCM]
- Original Design Manufacturer [ODM]
- Original Equipment Manufacturer [OEM]
- Out of Box Audit [OOBA]
- Outgoing Quality Control [OQC]
- Over-the-Air Update [OTA]
- Overall Yield
p
- Packout
- Part Number [PN]
- Personal Computer [PC]
- Phase-Locked Loop [PLL]
- PHY
- Plan of Record [POR]
- Platform-Security Architecture
- PNP
- Pointer Array Pattern
- Port-Mapped I/O [PMIO]
- Position-independent code
- POSIX
- Post Ramp Qualification [PRQ]
- Post-Snap
- Power Management Bus [PMBus]
- Power Management IC [PMIC]
- Power Management Unit [PMU]
- Power-on Self Test [POST]
- Preemptive Scheduling
- Preemption
- Presentation Time Stamp [PTS]
- Pressure-Sensitive Adhesive [PSA]
- Principal Engineer
- Printed Circuit Board [PCB]
- Printed Circuit Board Assembly [PCBA]
- Priority Inheritance
- Priority Inversion
- Process Engineering
- Product Design [PD]
- Product Development
- Product First Offline [PFOL]
- Product Requirements Specification [PRS]
- Product Requirements Document [PRS]
- PRD [PRS]
- Production Validation and Test [PVT]
- Program Counter
- Instruction Pointer
- Program Loader
- Loader
- Program Status Register [PSR]
- Programmed Input/Output [PIO]
- Project Lifecycle Management [PLM]
- Project Manager [PM]
- Proof-of-Concept [POC]
- Proto Stage [Proto]
- Prototype [PT]
- Provisioning
- PTZ
- Pull-down
- Pull-up [PU]
- Purchase Order [PO]
- Push-pull
- Python
r
- Race Condition
- Data Race
- Radio-Frequency Choke [RFC]
- Radio-Frequency Identification [RFID]
- Ramp
- RAND
- Rate Monotonic Scheduling [RMS]
- Rate Monotonic Analysis [RMS]
- Rational Unified Process [RUP]
- RBOM
- README
- Real-Time Clock [RTC]
- Real-Time for the Masses [RTFM]
- Real-Time Operating System [RTOS]
- Reduced Instruction Set Computer [RISC]
- Reentrant
- Region of Interest
- Area of Interest
- Relative Illuminance [RI]
- Remote Method Invocation [RMI]
- Remote Invocation [RMI]
- Remote Procedure Call [RPC]
- Request for Quote [RFQ]
- Requirement
- Research and Development [R&D] [R&D]
- Resource Acquisition is Initialization [RAII]
- Scope Bound Resource Management [RAII]
- Rest of BOM [RBOM]
- Retest Rate
- Return Material Authorization [RMA]
- Return on Investment
- Return Stack Buffer [RSB]
- Reusability
- RISC-V
- ROI
- Root Cause [RC]
- Root of Trust [RoT]
- Round-Robin Scheduling
- Run loop
- Run-Time Type Information [RTTI]
- Rust
- RX
s
- SAE
- Sanitizer
- TSan
- Thread Sanitizer
- ASan
- Address Sanitizer
- UBSan
- Undefined Behavior Sanitizer
- Memory Sanitizer
- MSan
- SARA
- Scalable Vector Extension [SVE]
- Schematic
- Scrap Rate
- SD Extended Capability [SDXC]
- SD High Capacity [SDHC]
- Secure Boot
- Secure Digital Input/Output [SDIO]
- Secure Hash Algorithms [SHA]
- Secure Processing Environment [SPE]
- Secure Secret Storage
- Secure Store
- Semaphore
- Separation of Concerns
- Serial Number [S/N] [S/N]
- Serial Peripheral Interface [SPI]
- Serializer/Deserializer [SERDES]
- Service-Level Agreement [SLA]
- Service-Oriented Architecture [SOA]
- Service View [SvcV]
- Shared Library
- Shared Object
- Dynamically Linked Library
- Dynamic Library
- Sharing and Reusing Architectural Knowledge [SHARK]
- SHARK
- Shop Floor Control [SFC]
- Single-Instruction, Multiple Data [SIMD]
- Single Responsibility Principle
- Small Business Innovation Research [SBIR]
- Society of Automotive Engineers [SAE]
- Software Architecture Review and Assessment [SARA]
- Software as a Service [SaaS]
- Software Engineering [SWE]
- SwEng [SWE]
- Software of Unknown Pedigree [SOUP]
- Software Process Improvement
- Software Product Line [SPL]
- Software Configuration Management [SCM]
- Source Code Management [SCM]
- SPE
- Special Function Register [SFR]
- Specification and Description Language [SDL]
- Split Stacks
- Segmented Stacks
- SRP
- Stack Buffer Overflow
- Stack Resource Policy [SRP]
- Stack Smashing Protection [SSP]
- Stack Protector [SSP]
- Staged Rollout
- Stakeholder
- Standard Template Library [STL]
- Start of Frame [SOF]
- Static Analysis
- Static Library
- Stock Keeping Unit [SKU]
- Strategy Pattern
- Subject-Matter Expert [SME]
- Successive Approximation Register [SAR]
- Successive Approximation Register ADC [SAR ADC] [SAR ADC]
- Supply Chain Attack
- Supply Chain Management
- Surface Mount Assembly [SMA]
- Surface Mount Technology [SMT]
- Switching Regulator
- Switching Voltage Regulator
- Symmetric Multiprocessing [SMP]
- SysML
- System-in-a-Package [SIP]
- System Management Bus [SMBus]
- System-on-a-Chip [SoC]
- System-on-Module [SOM]
- System Under Test [SUT]
- System View [SV]
- Systems Theory
- Systems Thinking
t
- Tape-Automated Bonding [TAB]
- Target Hardware Bottleneck
- Technical Standards View [TV]
- Template Method Pattern
- Template Method
- Test-Driven Development [TDD]
- Test Issue List [TIL]
- Testability
- The Open Group Architecture Framework [TOGAF]
- Thermal Cycling [T/C] [T/C]
- Thermal Interface Material [TIM]
- Thermocouple
- Third-Party Logistics [3PL]
- Throughput Yield
- Thumb
- Thumb-2
- Tier 1/2/3 CMs
- Tier 1/2/3 Supplier
- Time Slicing
- Time to First Fix [TTFF]
- Tooling
- Top-half Handler
- Top-Level Context Diagram [TLCD]
- Tri-state Logic
- Three-state Logic
- Trusted Execution Environment [TEE]
- TX
u
- U.S. IoT Cybersecurity Improvement Act of 2020
- Ultra-Wide Band [UWB]
- Ultrasonic Sensors
- UML
- UN38.3
- Undefined Behavior [UB]
- Understandability
- Unified Assembler Language [UAL]
- Unit Testing
- Units-per-Hour [UPH]
- Usage Fault Status Register [UFSR]
- User Experience [UX]
- User Interface [UI]
- Uses
v
- VCC
- VDD
- Vector Floating Point [VFP]
- VEE
- Very-High Frequency [VHF]
- Virtual Memory Address [VMA]
- VSS
w
- Wafer-Level Packaging [WLP]
- Warehouse [WH]
- Watchdog Timer [WDT]
- Weak Linking
- Weakly linked
- Whole/Part Relationship
- Composition
- Aggregation
- Wi-Fi 802.11bf [802.11bf]
- Windows Subsystem for Linux [WSL]
- Wireless Access Point [WAP]
- Work Breakdown Structure [WBS]
- Work-in-Progress [WIP]
- Working Sample [WS]
- Works-Like Prototype
y
- YAML
- Yield
z
- Zephyr
- Zephyr Bus [ZBus]